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Semiconductor and PV/Solar
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MX 102-8
For:
Thickness, TTV
Features:
Up to four thickness measuring range user selectable
Dynamic range 100 or 350µm
Wafer diameter 6" and 8"
Accuracy 0.1µm
Resolution 10nm
Spartial resolution 1mm
4 scans
Software MXNT
Products by Series
Thickness, TTV
MX 10x series
Gauges up to 200mm (8")
MX 102-6
MX 102-8
Gauges up to 300mm
MX 1012
Gauges up to 450mm
MX 1018
Thickness, TTV, Resistivity, P/N
MX 15x
Thickness, TTV, Geometry, Stress*
MX 20x series
One point thickness
MX 30x series
Resistivity, Thickness, TTV, P/N
MX 60x series
Surface Profile, Thickness, Geometry
MX 70x series