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MX 608-q

Special tool for PV/Solar Wafers

For:

Thickness, TTV, Resistivity

Features:

  • One or two scans (90°) possible
  • 1 up to 57 measurement points
  • Wafer type 125x125 and 156x156mm
    (and pseudo square)

     Thickness:

  • Range 150 - 350µm
  • Accuracy ±1µm
  • Resolution 10nm

    Resistivity:

  • Range 0.1mohm*cm up to 50 ohm*cm