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MX 70x

High Resolution Thickness and Surface Profiler for as-sawn Wafers

The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.

Please note: The MX 70x series is only available as a module on automatic robot systems, since a precise alignment is necessary.

MX 70x Types

MX Type Name Wafer diameter [mm]
MX 7012 300