MX 70x
High Resolution Thickness and Surface Profiler for as-sawn Wafers
The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
Please note: The MX 70x series is only available as a module on automatic robot systems, since a precise alignment is necessary.
MX 70x Types
| MX Type Name | Wafer diameter [mm] |
| MX 7012 | 300 |