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MX 204-8-49-q

Application

Automatable geometry gauge for 125–156mm solar wafers.

The MX204-8-49-q works as manually loaded stand-alone tool as well as fully integrated in automated robot systems. With its 49 measuring points it controls thickness, bow and warp in high resolution. Different wafer sizes can be used without changeover thanks to the upstream centering station. Comes with our powerful MX-NT operating software.


Measurement type

Thickness Flatness (TTV) Bow Warp Sori

Features

Wafer Diameter 125mm, 156mm
Thickness Accuracy ±1 µm
Resolution 0.1µm
Thickness range 200 - 600 µm
Automatic wafer geometry gauge yes
Software MXNT

WHICH TOOL
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Heiko Rings

+49 (0)721 83118-16
sensors(at)eh-metrology.com

 

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