EN Deutsch Chinesisch

OEM INTEGRATED
inline measuring modules

Scroll down for more
Scroll down for more

Our OEM in-line modules are measuring wafer geometry data on the fly between automated manufacturing processes.

Completely self-calibrating for effortless usage.

Scroll down for more

Home > Products > OEM Integrated Tools

OEM Integrated Tools
Filter
Reset all filters
Filter
Reset all filters
Cancel
Ok
Wafer Size
Characteristica
Compatible with
Wafer Properties
Wafer Form
Reset all filters<

MX 152/153

OEM integrated thickness and resistivity gauge for 125 mm up to 230 mmm solar wafers.
Detail of MX3014-Z Measurement Tool for wafer thickness by E+H Metrology

MX 3014-Z

OEM integrated thickness gauge for 100-200mm silicon and insulating wafers.

No Match? No Problem!

We are able to customize our products to a wide range of technical specifications. Which are yours?

WHICH TOOL
fits my needs?

You have questions, wishes or an order?
We will be happy to consult you personally.


E+H Metrology is committed to protecting and respecting your privacy. We only use your personal information to administer your account and to provide the products and services you have requested.

Portrait of Peter Michel, Product Sales Manager of E+H Metrology

Peter Michel

+49 (0)721 83118-17
sales(at)eh-metrology.com

 

Scroll down for more
Search form