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MX10 - HIGH RESOLUTION
silicon wafer measurement

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The MX10 series measures thickness and flatness (TTV) on silicon wafers fast and with high accurancy. It can be adapted to different thickness ranges within seconds.

Measurement types for the MX 10 Series:

Thickness Flatness (TTV)
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Home > Products > Manual Tools > MX10 Series

MX10 Series

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Portrait of Peter Michel, Product Sales Manager of E+H Metrology

Peter Michel

+49 (0)721 83118-17
sales(at)eh-metrology.com

 

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