EN Deutsch Chinesisch

MX30 - ONE-POINT THICKNESS
contactless wafer gauge

Scroll down for more
Scroll down for more

The MX30 series measures the thickness of a wide range of wafers sizes and materials. Suitable for process control, research and development.

Measurement types for the MX 30 Series:

Thickness
Scroll down for more

WHICH TOOL
fits my needs?

You have questions, wishes or an order?
We will be happy to consult you personally.


E+H Metrology is committed to protecting and respecting your privacy. We only use your personal information to administer your account and to provide the products and services you have requested.

Peter Michel

+49 (0)721 83118-17
sales(at)eh-metrology.com

 

Scroll down for more