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for efficient wafer production

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Equipped with belts, robot arms, waferstations and many more, most of our manual tools can be integrated into high efficient wafer production processes.

Our groundbreaking Global Nanoscope provides deep, reliable nanometer-scale insights onto surfaces of wafers and other reflective materials in one piece without stitching.

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fits my needs?

You have questions, wishes or an order?
We will be happy to consult you personally.

E+H Metrology is committed to protecting and respecting your privacy. We only use your personal information to administer your account and to provide the products and services you have requested.

Peter Michel

+49 (0)721 83118-17


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