Overview, insight and outlook In one process step: What was previously unthinkable in semiconductor manufacturing, the Global Nanoscope makes measurable. The entire surface of your wafer or any reflective surface is measured completely within just 30 seconds, providing reliable nanometer-scale insights that safeguard your process chain. Whether for incoming inspection in chip manufacturing or in process control during wafer fabrication: What was previously beyond the measurable, the Global Nanoscope makes visible.
The Global Nanoscope combines innovative technology and multiple fields of application with proven benefits such as seamless integratability and excellent support.
The application possibilities of the GNS are as comprehensive as its range of features. Let us inspire you!
The Global Nanoscope can also be used in many other industries such as medical technology, energy or research and development.
Talk to our team about your requirements!
You already know Makyoh methods? Our proprietary and AMA-approved Advanced Makyoh technology goes one step further than was previously measurable:
Multifunctional high-end measuring system for fast, non-contact, non-destructive, motionless measurement of all reflective surfaces up to 300mm.
Wafer diameter | up to 300 mm |
Dynamic range | gradient: ±0.14°, bow up to 100 μm |
Lateral resolution | 110 μm |
Resolution (height) | 1 nm (typically, with small bow below 50 μm) |
Standard Deviation | 1 σ ≤ 1 nm (n=31) |
Edge Exclusion | 1mm (Notch + Mount) |
Measuring time | 30 sec |
Calculation time | 1 - 2 minutes |
Vibrational stability | VC-A (~50 μm/s [4 - 80 Hz]) |
Typical data size per Wafer | 50 MB (500 MB full analysis data) |
“The Global Nanoscope is comparable to a moon rocket: We don't even know all the applications that this device will yet offer us.”
Customer · From: E+H customer & partner survey 2021
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