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Industries
Industries
Semiconductor & MEMS
Metrology for microelectronics, wafer and chip manufacturing
Research & Development
Innovative measurement technology for universities, research institutions and corporate development
Wafer Reclaim
Cost-effective, fast and reproducible measurement systems for reclaim & recycling
Technical Ceramics
Reliable measurement results for high-speed production cycles of sensitive high-performance ceramics
Mechanical Engineering
Measurements on turbines, engines and plain bearings
Sensor Systems
Customized capacitive sensor systems for extreme environmental conditions
Photovoltaic & Solar
Measuring instruments for inspection, qualification and process control of photovoltaic solar wafers.
Applications
Applications
Surfaces
Waviness
Saw Marks
Roughness
Nanotopography
Geometry
Thickness
TTV (total thickness variation)
Warp and Bow
Film Stress
Electrical Properties
Resistivity
Sheet Resistance
P/N Dotation
Axles, Shafts and Bearings
Turbines and Motors
Shaft displacement on slide bearings
Axle Concentricity
Material Properties
Modulus of elasticity
Thermal expansion
Distance at lowest temperature
Automation
Our engineers develop efficient automation solutions for Industry 4.0
Products
Products
Manual Tools
MX10 Series
MX 102-6
MX 102-8
MX 1012
MX 1018
MX20 Series
MX 203-4-21
MX 203-4-37-Q
MX 203-6-33
MX 203-6-33-B
MX 203-6-33-Q
MX 203-8-37
MX 203-8-37-B
MX 203-8-49-B
MX 203-58-37-B
MX 204-6-33
MX 204-6-13-V
MX 204-8-21-V
MX 204-8-21-TKO2
MX 204-8-37
MX 204-48-37
MX 2012
MX 2012-H
MX 2013
MX 2018-W
MX30 Series
MX 301-8
MX 301-AC
MX 301-Q
MX 3012
MX 3012-AC
MX 3014
MX 302
MX60 Series
MX 601
MX 604
MX 604-B
MX 604-S
MX 604-ST
MX 608
MX 6012
MX70 Series
MX 7012
MX 7018
OEM Integrated Tools
MX 152/153
MX 3014-Z
Automated Tools
Robot Sorters
Belt Sorters
Global Nanoscope
Photovoltaic & Solar
MX 204-8-73-q
MX 204-8-49-q
MX 203-6-41-q
MX 301-AC
MX 3012-AC
MX 604-ST
Sensor Systems
Distance Meters
MW 210-501
MW 210-700
MW 210-13-2
MW-V-2K
MW-V
MW-V-F
MZ1-M Pre-amplifier
Standard Sensors
AW 210-14-1
AW 210-53-3
AW 210-33-2
AW 210-23-1
AW 210-13-3
AW 210-13-2
AW 210-52-1
AW 210-22-3
AW 210-22-1
AW 210-51-1
Customized Sensors
Measuring Cables
L 33-11
L 33-12
L 33-13
L 33-14
L13-11
L13-12
L13-13
L13-14
Software
Operating Software
Waferstudio
Services
Services
Contract Measurements
Improved products for a stronger market position: With our contract measurements for wafers of any size and various materials
Company
Company
About E+H Metrology
Experts in high technology for the outer limits of the measurable: Subnanometer measurement equipment and software.
Management
Innovation is where dedicated engineers, developers, physicists and mechanics bring their skills together to create "made to measure" excellence.
Career
We want to not only further develop technologies, but also create innovations and value. Are you with us?
Distributors & Partners
Our global network
Glossary
All about precision measurement
Contact
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