Metrology Solutions for the
Semiconductor and PV/Solar
World
MX 301-8
For:
Thickness
Features:
- Default thickness range 200 - 1000µm
- Dynamic Range 800µm
- Wafer diameter up to 8"
- Accuracy ±0.5µm
- Resolution 0.1µm
- Switchable to measure high res material
- Software EHMaster