is the Japanese word for Warp. According to the JEITA standard, it represents the
maximum variations between individual points on the upper side of the wafer with
respect to a least squares fit plane based on these points. E+H supplies special
probe heads with multiple resting points for the wafer to approximate the required
plane.
In direct contact, we can best determine how we can help you overcome your challenges. Write to us:
Headquarters
E+H Metrology GmbH
Griesbachstraße 12
Benzstraße 5-9
76185 Karlsruhe
+49-721-83118-0
info(at)eh-metrology.com
Headquarters
E+H Metrology GmbH
Griesbachstraße 12
Benzstraße 5-9
76185 Karlsruhe
+49-721-83118-0
info(at)eh-metrology.com